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Semiconductor Material and Device Characterization
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Semiconductor Material and Device Characterization Hardcover - 1990

by Schroder, Dieter K

  • Used
  • near fine
  • Hardcover

Description

Somerset, New Jersey, U.S.A.: John Wiley & Sons Inc, 1990 hardback book and dust jacket in near fine condition. Hardcover. Near Fine/Near Fine.
Used - Near Fine
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Details

  • Title Semiconductor Material and Device Characterization
  • Author Schroder, Dieter K
  • Binding Hardcover
  • Edition First Edition; F
  • Condition Used - Near Fine
  • Pages 624
  • Volumes 1
  • Language ENG
  • Publisher Somerset, New Jersey, U.S.A.: John Wiley & Sons Inc, New York
  • Date 1990
  • Bookseller's Inventory # 121490
  • ISBN 9780471511045 / 0471511048
  • Weight 2.11 lbs (0.96 kg)
  • Dimensions 9.53 x 6.47 x 1.18 in (24.21 x 16.43 x 3.00 cm)
  • Library of Congress subjects Semiconductors, Semiconductors - Testing
  • Library of Congress Catalog Number 89024881
  • Dewey Decimal Code 621.381

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