Description:
Hardback. New. The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology.
![Aberration-Corrected Analytical Transmission Electron Microscopy](https://d3525k1ryd2155.cloudfront.net/f/519/518/9780470518519.OL.0.l.jpg)
Stock Photo: Cover May Be Different
Aberration-Corrected Analytical Transmission Electron Microscopy Hardcover - 2011 - 1st Edition
by Rik Brydson
From the rear cover
Electron microscopy has undergone significant developments in recent years due to the practical implementation of schemes which can diagnose and correct for the imperfections (aberrations) in both the probe-forming and the image-forming electron lenses. This book presents the background and implementation of techniques which have allowed true imaging and chemical analysis at the scale of single atoms as applied to the fields of materials science and nanotechnology.
Edited and written by the founders of the world's first aberration corrected Scanning Transmission Electron Microscope facility (SuperSTEM at Daresbury Laboratories in the UK), this text:
- Presents the theory, instrumentation and applications of aberration correction in transmission electron microscopes
- Is based on an established course taught at postgraduate summer schools by leaders in this field.
- Is essential reading for researchers involved in the analysis of materials at the nanoscale
Ideal for final-year undergraduates and postgraduate students, as well as academics and industrialists involved in electron microscopy, this book can be used as a component of courses in nanotechnology, materials science, physics, chemistry or engineering disciplines.
Details
- Title Aberration-Corrected Analytical Transmission Electron Microscopy
- Author Rik Brydson
- Binding Hardcover
- Edition number 1st
- Edition 1
- Pages 304
- Volumes 1
- Language ENG
- Publisher Wiley
- Date 2011-09-26
- Features Bibliography, Index, Table of Contents
- ISBN 9780470518519 / 0470518510
- Weight 1.25 lbs (0.57 kg)
- Dimensions 9.1 x 6.2 x 0.8 in (23.11 x 15.75 x 2.03 cm)
- Library of Congress subjects Aberration, Transmission electron microscopy
- Library of Congress Catalog Number 2011019731
- Dewey Decimal Code 502.825
About the author
More Copies for Sale
![Aberration-Corrected Analytical Transmission Electron Microscopy](https://d3525k1ryd2155.cloudfront.net/h/356/845/1126845356.0.m.jpg)
Aberration-Corrected Analytical Transmission Electron Microscopy
by Rik Brydson
- New
- Hardcover
- Condition
- New
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780470518519 / 0470518510
- Quantity Available
- 1
- Seller
-
Southport, Merseyside, United Kingdom
- Item Price
-
$69.85$12.74 shipping to USA
Show Details
Item Price
$69.85
$12.74
shipping to USA
![Aberration-Corrected Analytical Electron Microscopy (RMS - Royal Microscopical Society)](https://d3525k1ryd2155.cloudfront.net/f/519/518/9780470518519.IN.0.m.jpg)
Stock Photo: Cover May Be Different
Aberration-Corrected Analytical Electron Microscopy (RMS - Royal Microscopical Society)
by Brydson, Rik (Editor)
- New
- Hardcover
- Condition
- New
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780470518519 / 0470518510
- Quantity Available
- 2
- Seller
-
Exeter, Devon, United Kingdom
- Item Price
-
$78.04$12.81 shipping to USA
Show Details
Description:
Wiley-Blackwell, 2011. Hardcover. New. 1st edition. 296 pages. 9.25x6.25x0.75 inches.
Item Price
$78.04
$12.81
shipping to USA
![Aberration-Corrected Analytical Transmission Electron Microscopy](https://d3525k1ryd2155.cloudfront.net/h/560/944/1476944560.0.m.jpg)
Aberration-Corrected Analytical Transmission Electron Microscopy
by Rik Brydson
- New
- Hardcover
- Condition
- New
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780470518519 / 0470518510
- Quantity Available
- 10
- Seller
-
Southport, Merseyside, United Kingdom
- Item Price
-
$79.04$12.74 shipping to USA
Show Details
Description:
Hardback. New. The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology.
Item Price
$79.04
$12.74
shipping to USA
![Aberration-Corrected Analytical Electron Microscopy](https://d3525k1ryd2155.cloudfront.net/f/519/518/9780470518519.IN.0.m.jpg)
Stock Photo: Cover May Be Different
Aberration-Corrected Analytical Electron Microscopy
- New
- Hardcover
- Condition
- New
- Binding
- Hardcover
- ISBN 10 / ISBN 13
- 9780470518519 / 0470518510
- Quantity Available
- 3
- Seller
-
Woodside, New York, United States
- Item Price
-
$86.38$3.99 shipping to USA
Show Details
Description:
John Wiley & Sons , pp. 296 Index. Hardback. New.
Item Price
$86.38
$3.99
shipping to USA